Wafer patterns: compare940 and1550 nm before choosing the inspection band
The real source labels this a wafer inside-hole inspection. Its1550 nm capture separates the repeated central features more clearly from a bright background than the940 nm capture.
Validate the sample material before generalizing a spectral result.
Real camera capture
- Proposed light housing (spec)117 × 117 × 23 mm
- EvidenceReal application-lab captures
- Camera (proposed)1280 × 1024 InGaAs
- Scene field100 × 80 mm scene framing only; illustrative, not a printed lens field
Lighting application-lab image sheet
What the camera saw
Cropped from the source test sheet; original test annotations are retained. Captures are not generated or enhanced. Drag a comparison slider, or open any image full size.
SWIR1550 nm: Source1550 nm capture: repeated central dark features stand out in the bright regions.
The challenge
A surface view can obscure features associated with a wafer structure. Transmission and reflection change with material, thickness and wavelength, so the chosen band needs a real sample trial.
How it was solved
The source compares NIR940 nm with SWIR1550 nm, without naming a complete camera, lens or light model. The proposed1550 nm panel and SWIR camera/lens are a transmission-trial concept.
The actual wafer material, thickness and original illumination geometry are not supplied. The proposed panel arrangement is not a reproduction of the tested system.
Why it works
- 1
A change in relative transmission or reflection can make a repeated feature pattern easier to distinguish.
- 2
The image does not establish the physical size or depth of the central features, wafer composition or a verified internal-defect classification.
Lighting application-lab image sheet
Evidence you can inspect
The1550 nm capture has stronger visible separation of the repeated central features.
The source identifies the wafer inside-hole application and the940/1550 nm bands; no material thickness, field, feature size or camera model is given.
An application-lab lighting demonstration, not a customer deployment or a qualified production inspection. Proposed camera, lens, fixture and scene spacing require a fresh trial. Source observations do not establish a defect-size limit, accuracy guarantee or production false-call rate.
From image contrast to a production decision
What to validate on your part
- 01
Verify the material stack
Use the actual wafer material, thickness, coatings and required feature before assuming infrared transmission.
- 02
Confirm the light arrangement
Trial the proposed panel transmission geometry and compare reflection if the sample requires it.
- 03
Validate feature decisions
Use independently confirmed good and defective samples and calibrated scale before defining detection or measurement limits.
From the demo to your test bench
Parts in this setup
LightOur pick
LS-3FT100100-SWIR
Short wavelength infrared light, 117 x 117 x 23 mm (LS-3FT100100-SWIR)
Proposed1550 nm transmission panel;117 ×117 ×23 mm housing,100 ×100 mm emitting area. The source exact light is not identified.Wavelength: 1550 nm proposed, matching the labelled source band
Configuration to confirm
In proposed setup
CameraOur pick
MV-CI013-GS-NN
Hikrobot MV-CI013-GS-NN 1.3MP SWIR Camera, IMX990, GigE, fanless
Proposed Hikrobot InGaAs camera: 1280 × 1024, 5 µm pixels, C-mount and specified spectral response 0.4–1.7 µm. The source does not identify its camera.
Price on request
In proposed setup
LensOur pick
LS-KF2514M-5MP-NIR-V2
25mm, F1.4, 1", 900-1700nm, C-mount, SWIR lens (LS-KF2514M-5MP-NIR-V2)
25 mm F1.4 SWIR lens, C-mount, coating specified for 900–1700 nm. Printed minimum object distance is 0.38 m; the proposed scene uses 400 mm from the lens front. Its field and spacing are illustrative, not a claimed printed magnification/working-distance pair.
$449.00
In proposed setup
Camera test stationOur pick
LS-BT-XZ-G-8-6045
Camera stand with XZ adjustment and glass tray, height 800 mm (LS-BT-XZ-G-8-6045)
800 mm column, 600 × 450 mm breadboard, glass tray and two lighting holders. Proposed bench fixture; actual load, travel, clamps, mounting fasteners and light clearance must be confirmed.
$359.00
In proposed setup
"Tested" identifies the part named in the source. "Our pick" is a proposed alternative or supporting part. Confirm colour, optics, controllers, power supplies, cables and mounting before ordering.
The set-up
| Source camera | Not identified in the source sheet |
|---|---|
| Camera and lens | Proposed catalog components |
| Scene field | 100 × 80 mm scene framing only; illustrative, not a printed lens field |
| Lens-to-part in proposed scene | 400 mm; illustrative spacing above printed minimum object distance |
| Mounting (proposed) | LS-BT-XZ-G-8-6045 · catalog test station with two lighting holders |
Mount the optics with intent
The station is an optical test bench, with its two lighting holders included in the catalog listing. The 3D column and base follow the published height and footprint. Carriages, clamps and part supports are schematic: confirm camera screw pattern, lens support, light fasteners, permissible load and actual travel before ordering.
Complete the electrical system
Select a controller against the exact light voltage, drive mode and power, then confirm camera data/power/I/O cables and a suitable PC. These are not silently added to the proposed optical kit.
Build this system
Start from this setup, adapt it to your part.
The configurator opens with this study's camera, lens, light and station picked. Swap any part, check fit and price, then buy or ask for a quote.
Camera and available lens CAD are published models. Light envelopes and the station base/height use printed dimensions. Part shapes, brackets, holders, shielding and spacing are illustrative; they are not reconstructions of a source part or a complete mechanically validated assembly. Light paths explain the proposed arrangement and do not simulate optical performance. The SWIR scene field is illustrative; no measured field or printed magnification/working-distance relationship is asserted. Purple is a display convention for invisible illumination.
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Make the next trial specific.
Tell us the part size, smallest defect or tolerance, available working distance, material and line speed. Include what a good part and a reject look like.
About this case study: the photos and camera images come from the application laboratory of the maker of the lighting and optics we sell, imaged on the parts shown; your results depend on your part, camera and set-up. This is an application-lab study, not a LumaSpec customer deployment. Source figures are reported results; proposed components require a fresh trial. The 3D scene illustrates the arrangement and does not simulate imaging performance.