Wafer positioning: use the circular edge and flat segment as visible geometry
The source image shows a bright circular wafer-like outline with a flat segment on its left side. Those features provide a localization trial, but the source supplies no wafer diameter or measured position error.
Use the visible edge geometry, then prove the coordinate accuracy on the actual wafer.

Real camera capture
- Light in sourceLS-FCS150 · white
- EvidenceReal application-lab image
- Imaging kitCamera, lens and fixture proposed
- AcceptanceValidate on representative parts
Lighting application-lab catalog capture
What the camera saw
Cropped from the source test sheet; original test annotations are retained. Captures are not generated or enhanced. Drag a comparison slider, or open any image full size.
The challenge
A circular outline alone does not provide a unique in-plane orientation; a flat segment can provide an additional reference.
Background reflections and edge cropping must not shift the location result.
How it was solved
The source identifies the white flat coaxial light and labels the example wafer location. The visible feature is a flat edge segment, not a documented notch.
The proposed 84.456 × 70.656 mm field is a bench-sample view. It is not a claim to image an unspecified production wafer completely; select another field and light area if the actual wafer is larger.
Why it works
- 1
The bright boundary and flat segment provide different geometric constraints for a localization algorithm to evaluate.
- 2
Feature visibility does not establish position accuracy, wafer-edge quality or suitability for a handling process.
Lighting application-lab catalog capture
Evidence you can inspect
The circular boundary and a distinct left-side flat segment are visible.
The catalog captions wafer-location inspection under the white LS-FCS150.
Source wafer diameter, field, edge tolerance, algorithm, calibration and position error are unspecified. The representative 3D specimen is not a source dimension.
From image contrast to a production decision
What to validate on your part
- 01
Verify the actual wafer geometry
Confirm diameter, flat or notch requirements and the field needed for the real handling operation.
- 02
Test edge visibility
Include accepted edge reflectivity, position, rotation and background variation.
- 03
Measure the coordinate result
Check calibration and localization error on independently known positions before guiding motion.
From the demo to your test bench
Parts in this setup
LightTested
LS-FCS150
150 x 150 mm Flat coaxial light (LS-FCS150)
White LS-FCS150 explicitly named in the wafer-location example. Printed light-guide area 150 × 150 mm and outer size 190 × 190 × 10 mm.
$509.00
In proposed setup
CameraOur pick
MV-CS050-10GM(NPOE)
Hikrobot MV-CS050-10GM(NPOE) 5 MP GigE area scan camera, IMX264, Gen 2 basic version, Mono, Without PoE
5 MP monochrome global-shutter camera proposed for a contrast trial. Confirm field, sampling, exposure and algorithm on the actual application.
$819.00
In proposed setup
LensOur pick
LS-KF1628M-ML
16mm, F2.8, 1.1", C-mount, Macro lens (52 mm (-0.25X) to 546 mm (-0.03X)) (LS-KF1628M-ML)
Proposed 16 mm C-mount macro lens at its printed 0.1x magnification / 152 mm working-distance pair. The proposed 2448 × 2048 sensor with 3.45 µm pixels gives a derived 84.456 × 70.656 mm field; confirm focus, coverage and residual distortion on the real sample.
$319.00
In proposed setup
Camera test stationOur pick
LS-BT-XZ-G-6-6045
Camera stand with XZ adjustment and glass tray, height 600 mm (LS-BT-XZ-G-6-6045)
600 mm column, 600 × 450 mm breadboard, XZ adjustment, glass tray and two lighting holders as listed. Proposed bench fixture; confirm loads, travel and camera/lens clamps.
$359.00
In proposed setup
"Tested" identifies the part named in the source. "Our pick" is a proposed alternative or supporting part. Confirm colour, optics, controllers, power supplies, cables and mounting before ordering.
The set-up
| Tested light | LS-FCS150, white |
|---|---|
| Source camera / lens | Not specified in the source image caption; proposed parts below |
| Proposed lens point | 0.1x at 152 mm, printed lens pair |
| Derived proposed field | 84.456 × 70.656 mm = sensor dimensions / 0.1x; not a source test field |
| Light-guide area (printed) | 150 × 150 mm |
| Housing (printed) | 190 × 190 × 10 mm |
| Whole-part coverage | Source diameter unknown; proposed field is for a representative bench specimen |
| Mounting (proposed) | LS-BT-XZ-G-6-6045; 600 mm column, 600 × 450 mm base, glass tray and two included lighting holders |
Mount the optics with intent
The station is an optical test bench, with its two lighting holders included in the catalog listing. The 3D column and base follow the published height and footprint. Carriages, clamps and part supports are schematic: confirm camera screw pattern, lens support, light fasteners, permissible load and actual travel before ordering.
Complete the electrical system
Select a controller against the exact light voltage, drive mode and power, then confirm camera data/power/I/O cables and a suitable PC. These are not silently added to the proposed optical kit.
Build this system
Start from this setup, adapt it to your part.
The configurator opens with this study's camera, lens, light and station picked. Swap any part, check fit and price, then buy or ask for a quote.
Camera and available lens CAD are published models. Lens and light envelopes use printed dimensions. The linked station uses its published base size and column height; carriage, brackets, fittings, parts and spacing are illustrative. Confirm load, travel, fasteners and clearances before ordering. Light paths explain the arrangement and do not simulate optical performance. Representative part geometry is illustrative, not reconstructed inspection evidence. The specimen and lighting angle are representative, not dimensions or settings recovered from the source capture.





