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Inicio / Case studies / Chip circuit detail at1300 nm
Application study · Semiconductor inspection

Chip circuits: compare1050 and1300 nm to expose useful internal detail

The source1300 nm fibre-light capture reveals a structured circuit pattern that is far less visible in its1050 nm comparison. The result illustrates spectral visibility, not a qualified test of hidden electrical defects.

Revealing structure is a prerequisite, not a hidden-defect result.

  • Proposed light housing (spec)117 × 117 × 23 mm
  • EvidenceReal application-lab captures
  • Camera (proposed)1280 × 1024 InGaAs
  • Scene field100 × 80 mm scene framing only; illustrative, not a printed lens field
3D view of the inspection set-up: camera, lens, light and partDrag to rotate · scroll to zoom
3D illustration · real CAD where available
Walk through this setup 5 guided stops
From component to inspection

Understand each choice.

Choose a stop to frame the part in 3D and see why it belongs in this setup. The component notes and links remain available if 3D cannot load.

Camera and available lens CAD are published models. Light envelopes and the station base/height use printed dimensions. Part shapes, brackets, holders, shielding and spacing are illustrative; they are not reconstructions of a source part or a complete mechanically validated assembly. Light paths explain the proposed arrangement and do not simulate optical performance. The SWIR scene field is illustrative; no measured field or printed magnification/working-distance relationship is asserted. Purple is a display convention for invisible illumination.

From the demo to your test bench

Build around the parts you can buy.

Explore each component, check its specifications and compare alternatives. The proposed quote includes the linked test station; its catalog listing includes two lighting holders.

Mount the optics with intent

The station is an optical test bench, with its two lighting holders included in the catalog listing. The 3D column and base follow the published height and footprint. Carriages, clamps and part supports are schematic: confirm camera screw pattern, lens support, light fasteners, permissible load and actual travel before ordering.

Configure the mounting station →

Complete the electrical system

Select a controller against the exact light voltage, drive mode and power, then confirm camera data/power/I/O cables and a suitable PC. These are not silently added to the proposed optical kit.

Lighting application-lab image sheet

Evidence you can inspect

Visible in the images

An underlying structured pattern is more visible in the source1300 nm capture than in its1050 nm capture.

What the source reports

The source names1050/1300 nm and fibre-optic1300 nm illumination; the complete source system and a defect-classification result are not given.

How to use this evidence

An application-lab lighting demonstration, not a customer deployment or a qualified production inspection. Proposed camera, lens, fixture and scene spacing require a fresh trial. Source observations do not establish a defect-size limit, accuracy guarantee or production false-call rate.

What the camera saw

Cropped from the source test sheet; original test annotations are retained. Captures are not generated or enhanced. Drag the comparison slider or use the image buttons.

Source1050 nm capture: the underlying pattern is faint.Source1300 nm fibre-light capture: circuit structure is more visible.SWIR1050 nmSWIR1300 nm fibre light
SWIR1050 nm: Source1050 nm capture: the underlying pattern is faint.
SWIR1300 nm fibre light: Source1300 nm fibre-light capture: circuit structure is more visible.
Chip pieces shown in the source sheet.
Chip pieces shown in the source sheet.

The challenge

A dark-looking chip surface can conceal useful underlying structure. Its visible appearance is not enough to choose a near-infrared inspection band.

How it was solved

The source explicitly calls the1300 nm illumination fibre-optic but does not name its exact engine, fibre head, camera or lens. The proposed1300 nm panel is a separate transmission-trial arrangement, not the original fibre system.

An optional1300 nm fibre-light engine is also shown as a proposed alternative. Its required fibre and output head must be specified before calling that alternative a complete optical system.

Why it works

  1. 1

    The relative transmission and reflection of the chip stack change with wavelength. A band that reveals structure can improve a later localization or comparison task.

  2. 2

    A visible circuit pattern does not prove continuity, identify a failure mechanism or guarantee access through every package material.

From image contrast to a production decision

What to validate on your part

A useful sample image is the starting point. These are the checks that turn the concept into a defensible inspection.

  1. 01

    Identify the stack

    Confirm the actual die/package material and the layer the inspection must reveal.

  2. 02

    Compare light delivery

    Test the proposed panel and, if needed, a specified fibre head on the same representative samples.

  3. 03

    Use confirmed defects

    Separate a visibility demonstration from defect detection by validating known good and independently confirmed defective parts.

Explore your inspection requirements

How many pixels cover your feature?

Compare feature coverage, camera pixel requirements and exposure using your own planning inputs. These are calculated planning values, not inspection results or an accuracy specification.

Editable planning scenario. Adjust these example inputs for your application; they are separate from the source test and 3D setup. Motion allowance and target coverage are starting points to validate, not acceptance limits. Pixel count starts from the proposed camera's catalog resolution.

Object sampling0.07812 mm/px
Pixels across feature6.4 px
Horizontal pixels for target1000 px
Motion during exposure0.128 px
Exposure ceiling from motion390.6 µs
Formulas and assumptions

The field, feature, speed and exposure start with neutral example values. They are not taken from the source test or the 3D illustration. Allowed motion starts at an editable 0.5-pixel example; it is not a recommended acceptance limit. Target coverage starts at an editable 5-pixel example; it is not a recommended detection or measurement threshold. The horizontal pixel count starts from the catalog Resolution row for MV-CI013-GS-NN. Use the effective width after cropping, binning or decimation if those modes are enabled.

  • Object sampling (mm/px) = field width (mm) / horizontal pixels.
  • Pixels across feature = feature width (mm) / object sampling (mm/px).
  • Horizontal pixels for target = field width (mm) × target pixels across feature / feature width (mm), rounded up to a whole pixel.
  • Motion (px) = speed (mm/s) × exposure (µs) / 1,000,000 / object sampling (mm/px).
  • Exposure for allowed motion (µs) = allowed motion (px) × object sampling (mm/px) / speed (mm/s) × 1,000,000.

The exposure result is the maximum duration from this motion allowance alone. At zero speed, motion sets no exposure limit; the camera, lighting, saturation and other constraints still apply. A shorter exposure does not itself guarantee a reliable inspection.

Field width and feature width refer to the same object plane. The motion calculation assumes uniform linear motion parallel to the field-width direction and a single exposure. It does not model perspective, vibration, rolling-shutter distortion, diffraction, defocus or optical distortion. A strobe may change the effective exposure.

The target result is a horizontal sampling requirement, not a camera recommendation or a change to the selected camera. It uses the effective image width after cropping, binning or decimation and does not determine the vertical resolution or sensor size. Pixel coverage alone does not establish detectability or measurement accuracy. Validate contrast, lens performance, working distance, illumination, calibration, camera exposure limits and the inspection algorithm on representative parts. Changing field width does not change the 3D model or certify that the proposed lens can achieve that field.

The set-up and the parts

Source cameraNot identified in the source sheet
Camera and lensProposed catalog components
Scene field100 × 80 mm scene framing only; illustrative, not a printed lens field
Lens-to-part in proposed scene400 mm; illustrative spacing above printed minimum object distance
Mounting (proposed)LS-BT-XZ-G-8-6045 · catalog test station with two lighting holders
Configure the standard components

Custom configuration requirements stay attached to this quote. The configurator starts with the standard parts; confirm the custom lights with your quote.

"Tested" identifies the part named in the source. "Our pick" is a proposed alternative or supporting part. The quote includes only cards marked "In proposed setup", with the quantities shown; other test arrangements are separate. Confirm colour, optics, controllers, power supplies, cables and mounting before ordering.

About this case study: the photos and camera images come from the application laboratory of the maker of the lighting and optics we sell, imaged on the parts shown; your results depend on your part, camera and set-up. This is an application-lab study, not a LumaSpec customer deployment. Source figures are reported results; proposed components require a fresh trial. The 3D scene illustrates the arrangement and does not simulate imaging performance.

More case studies

Start with your inspection requirement

Make the next trial specific.

Tell us the part size, smallest defect or tolerance, available working distance, material and line speed. Include what a good part and a reject look like.

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