LightingExplainer

Screen projection inspection for transparent part defects

Use screen projection inspection to reveal weak refractive defects in transparent parts, with distance, directionality and camera focus tests.

LumaSpec Vision10 min read Share on LinkedIn

On this page 10 sections
  1. 01Choose screen projection when the defect redirects light
  2. 02Understand how deflection becomes an intensity pattern
  3. 03Build the optical path around the screen
  4. 04Sweep distance and directionality separately
  5. 05Work through coverage and camera sampling
  6. 06Select trial hardware without assuming application performance
  7. 07Verify that indications belong to the part
  8. 08Recognize where the usual answer is wrong
  9. 09Check the complete trial before ordering
  10. 10Questions

A transparent part can have a clear outline while a shallow dent or flow line remains nearly invisible. Screen projection inspection addresses this problem by recording how the part redistributes directional light onto a separate screen. The camera measures the resulting intensity pattern rather than focusing directly on the material.

This approach suits transparent molded parts, films and glass when ordinary transmitted lighting reveals too little contrast. The practical decision is whether your defect changes ray direction enough to produce a repeatable pattern. You can test that decision by varying screen distance, illumination directionality and camera focus before committing to an optical assembly.

Choose screen projection when the defect redirects light

Start with the feature you need to detect, not the brightness of the light source. An opaque inclusion blocks light. A transparent surface depression may transmit almost as much light as its surroundings while changing the direction of the transmitted rays.

A diffuse backlight supplies rays from many directions. Their overlapping contributions can reduce the visibility of weak refractive features. More directional illumination can preserve the redistribution caused by those features, making a screen pattern easier to observe.

Inspection question Useful starting arrangement What the image represents
Is the outside dimension correct? Direct silhouette imaging The projected boundary
Is there an absorbing particle? Direct transmitted illumination Local transmission loss
Is there a shallow dent or refractive flow pattern? Directional illumination and a screen Redistribution of transmitted light
Is there a reflective surface scratch? A separate reflected-light trial Changes in reflected light

These methods can complement each other. Screen projection does not replace an edge measurement or establish defect depth automatically.

For the broader task of separating lighting problems from processing problems, start with glass defect detection before thresholding. For dimensional work, the comparison of directional and diffuse edge lighting addresses a different decision: stabilizing an edge rather than revealing weak internal patterns.

Understand how deflection becomes an intensity pattern

Consider a narrow bundle of rays crossing the part. A local surface slope or refractive-index variation changes the rays' exit directions. As those rays travel toward a screen, neighboring bundles can converge or spread apart.

Convergence raises the local irradiance; spreading lowers it. The screen converts that irradiance distribution into a visible pattern for the camera.

For a simplified one-dimensional model:

x_screen = x + L × theta(x) ray displacement = L × theta I_screen / I_reference ≈ 1 / [1 + L × dtheta/dx]

Here, x is the ray position at the part's exit plane, L is the distance from that plane to the screen, and theta is the small exit-angle deflection in radians. The intensity expression assumes uniform incident illumination, negligible absorption and no crossing of neighboring rays.

The distinction between displacement and contrast matters. A uniform angular deflection shifts a beam without necessarily creating a pattern across its interior. Spatial variation in deflection creates the local bright and dark regions.

For an illustrative deflection of 0.5 mrad:

  • At 100 mm separation, displacement is 100 × 0.0005 = 0.05 mm.
  • At 300 mm separation, displacement is 300 × 0.0005 = 0.15 mm.

Those figures describe ray displacement, not dent depth or guaranteed detection sensitivity. Both surfaces, part thickness and internal refractive structure can contribute to the same image.

Build the optical path around the screen

Arrange the trial as directional source, transparent part, diffusing screen, then camera. A translucent screen lets the camera view the transmitted pattern from the downstream side. Keep the screen approximately normal to the nominal illumination axis initially.

Focus the camera on the screen, not on the part. Place a temporary fine target at the screen plane, focus manually, then remove it. This separates poor screen-image focus from a weak optical signature.

Use a screen with uniform texture and sufficient spatial resolution for the expected pattern. A thick scattering sheet can spread light laterally and erase narrow features. A glossy sheet can produce directional reflections rather than a stable diffuse image.

Mount the part and screen independently so you can change their separation without disturbing camera focus. If you move the screen, refocus or move the camera to maintain its screen-plane relationship.

Start with fixed camera exposure, gain and image processing. Automatic adjustments can hide the contrast changes you are trying to compare. The lens and lighting test plan provides a useful framework for recording each configuration and its failure cases.

Sweep distance and directionality separately

Increasing screen distance can make weak deflections more visible, but it also increases sensitivity to illumination angular spread. Do not change distance and source geometry together during the first experiment.

An illustrative distance sweep is 25, 50, 100 and 200 mm, subject to available space. At each position, record the same acceptable part and the same known defect. Re-establish screen focus and record any change in camera field of view.

Finite illumination directionality introduces a useful estimate:

angular-spread blur ≈ L × delta_theta

Here, delta_theta represents the effective angular width of illumination contributing to the pattern. At 200 mm separation, an angular width of 0.5 mrad produces an estimated spread of 0.1 mm. An angular width of 5 mrad produces about 1 mm.

These are geometric estimates, not specifications for any catalog light. Screen scattering, camera focus and optical aberrations can add further blur.

Compare a directional source with a diffuse source while holding the part, screen and camera positions constant. Match the reference screen brightness without clipping highlights. Otherwise, a brightness difference may be mistaken for a directionality improvement.

Also test a small change in part angle. Refraction depends on incidence geometry, so an indication that is strong at one orientation may weaken at another. Avoid choosing an angle that works only for an unusually well-positioned sample.

Work through coverage and camera sampling

Consider a hypothetical transparent coupon measuring 40 × 30 mm. Suppose the screen is 200 mm behind the part, and the expected deflections remain within approximately ±5 mrad.

The maximum lateral displacement estimate is:

displacement allowance = 200 mm × 0.005 = 1 mm

Allow another 5 mm on each side for positioning variation and setup margin. The required screen region is then:

screen width = 40 + 2 × (1 + 5) = 52 mm screen height = 30 + 2 × (1 + 5) = 42 mm

A camera field covering 60 × 50 mm would include that region. With an illustrative image size of 1200 × 1000 pixels, sampling is:

horizontal sampling = 60 mm / 1200 pixels = 0.05 mm/pixel vertical sampling = 50 mm / 1000 pixels = 0.05 mm/pixel pattern sampling = 0.30 mm / 0.05 mm/pixel = 6 pixels

A 0.30 mm screen pattern would therefore span six pixels before accounting for blur. That is a sampling calculation, not proof that the pattern has enough contrast for detection. The camera-resolution guide for dimensional inspection explains the broader distinction between pixel coverage and measurement capability.

Camera resolution for the smallest feature
Units
Pixels needed
–
Sensor size
– MP
Smallest sensor that fits
–
Pixel on the part
– mm
Pixels across the feature, that sensor
–

Pixels needed = field / feature × pixels per feature on each axis (field incl. margin). The lens must resolve the pixels too: Nyquist = 1000 / (2 × pixel µm) lp/mm.

Find cameras with enough pixels Open the full calculator

Use the calculator to check screen-pattern sampling, entering the screen field rather than assuming it equals the part dimensions.

Illumination coverage is a separate check. A rectangular part measuring 40 × 30 mm has a diagonal of sqrt(40² + 30²) = 50 mm. A circular beam must cover that diagonal, plus positioning allowance, over its usable region. Screen size alone does not establish that the part receives uniform illumination.

Select trial hardware without assuming application performance

Browse collimated lights for directional-source candidates, then use the lighting finder to compare the available geometries. Beam coverage, mounting space and documented optical characteristics matter more than the category label alone.

The LS-CLM-0023 is a catalog candidate for a directional-illumination trial. Its listing does not establish screen-projection defect sensitivity or compatibility with a particular screen and camera.

Collimated lightsParallel (collimated) light sources for SDM telecentric lenses, beam 90 mm, length 223.9 mm (LS-CLM-0023)LS-CLM-0023
Size
50-100 mm
$1,489.00View partBuild a system with it

Use a standard source from the backlights category as a baseline rather than assuming directional illumination must be better. Some defects produce adequate absorption or silhouette contrast without a projection screen.

The LS-BKL-1468 is a standard-backlight comparison candidate. Keep its baseline images separate from claims about the directional arrangement.

BacklightsFlat Backlight, 150 x 150 mm, Red (LS-BKL-1468)LS-BKL-1468
Size
100-200 mm
Type
Standard
Voltage
24 V
$389.00View partBuild a system with it

The supplied catalog information does not establish angular spread, screen compatibility or a complete projection assembly for these candidates. Ask for the relevant optical data and an application review before ordering around a sensitivity target.

LightingCollimated lights

Parallel light for telecentric gauging

87 models · from $349.00

Do not assume a telecentric imaging lens can be attached to a light source as a collimator. Such an arrangement requires documented optical and mechanical compatibility, including source placement and aperture matching.

Verify that indications belong to the part

Record a reference image without the part, then insert an acceptable sample. This reveals screen texture, illumination nonuniformity and the normal optical signature of the material.

Next, translate the part while leaving the screen and camera fixed. A material-related indication should respond consistently to the part movement, although projection geometry can change its appearance. A mark that remains fixed on the screen is more likely to belong to the screen or illumination system.

Use multiple acceptable samples, known defects, repeated insertions and the expected positioning range. Include samples whose defects approach the actual acceptance boundary. A dramatic demonstration defect is insufficient evidence for a production threshold.

Flat-field normalization can reduce fixed illumination variation, but it cannot restore clipped highlights or recover detail lost to blur. Register images before subtraction when positional differences would otherwise generate false indications. The guide to reducing contour artifacts in image subtraction explains that failure mode.

Moving parts need another check: exposure blur. If a screen pattern translates at 200 mm/s and the allowable blur is 0.025 mm, the exposure estimate is 0.025 / 200 = 0.000125 s, or 125 µs. Measure projected-pattern motion rather than assuming it always equals conveyor motion. See the exposure-time guide for moving parts for the timing trade-off.

Recognize where the usual answer is wrong

This arrangement is closer to shadowgraph imaging than knife-edge schlieren. A conventional knife-edge schlieren system converts angular deflection into intensity changes by partially blocking light at a suitable focal plane. A projection screen alone does not provide that angular cutoff.

Consequently, weak refractive-index gradients do not always create a useful screen pattern. The spatial variation of the deflection field matters. Strong convergence can also create caustics, where rays overlap and the simple intensity formula no longer applies.

Other limitations include overlapping signatures from front and rear surfaces, curved parts that redirect most light away from the useful screen region, and broad patterns that vary with normal material structure. Stronger contrast can mean greater ambiguity rather than better inspection.

If the real requirement is dimensional gauging, investigate telecentric lenses through the lens finder. Their role is different from focusing a camera on a projection screen. The guide to when telecentric gauging is appropriate explains that choice.

Check the complete trial before ordering

Use this checklist to turn an attractive image into a defensible inspection proposal:

  • Define the reject condition. Describe the defect class and acceptance boundary, not simply a visible bright patch.
  • Document coverage. Check the illuminated part envelope, screen region and camera field separately.
  • Confirm screen focus. Verify it with a temporary target at the actual screen plane.
  • Record distance and orientation. Both change the projection signature and must be repeatable.
  • Preserve unsaturated images. Keep reference brightness, exposure and processing settings with the dataset.
  • Challenge normal variation. Include acceptable material structure, positioning changes and repeated handling.
  • Confirm optical compatibility. Obtain missing directionality, mounting and operating information before selecting an assembly.
  • Set a verification criterion. Require separation between acceptable and reject populations, not a single successful image.

Start the lighting configurator with your part envelope, candidate screen distances and smallest observed screen pattern. For help reviewing the optical path, send those requirements and representative images through application support.

Questions

Can screen projection inspection measure dent depth?

Usually not from the projection image alone. Its intensity depends on surface slopes, internal refractive structure, illumination geometry and screen distance. Different physical defects can produce similar patterns. Measuring depth requires an appropriate calibrated model or an independent measurement method, validated against representative samples.

Does the camera need a telecentric lens?

Not necessarily. The camera's immediate task is to resolve the projection screen, so field coverage, image quality and screen-plane geometry drive lens selection. A telecentric lens may serve a separate dimensional inspection task, but it is not automatically required for observing projected intensity patterns.

Why can increasing screen distance make detection worse?

Greater distance amplifies ray displacement but also magnifies the effects of illumination angular spread. Narrow indications may broaden, overlap or leave the useful screen area. Compare defect separation across several distances with screen focus and reference brightness controlled, then select the shortest distance that meets the inspection requirement.

Is a brighter light always better for screen projection?

Transmitted illumination needs sufficient usable coverage across the part's positioning envelope. Additional total output cannot compensate for poor directionality, uneven illumination or an unsuitable screen. Compare sources at similar unsaturated reference brightness so the trial evaluates optical geometry rather than merely comparing exposure levels.

How do you distinguish a defect from screen texture?

Dust, screen texture and normal material structure can all produce visible patterns. Move the part independently, capture reference images and compare multiple acceptable samples. An indication should follow a repeatable relationship to the material and correlate with the defined reject condition before it becomes a classification feature.